DocumentCode :
3153794
Title :
Effects Of Orientation On Thin-film Media Read/write Chracteristics
Author :
Aoi, H. ; Shiroishi, Y. ; Yoshida, K. ; Sugita, Y.
Author_Institution :
Central Research Lab., Hitachi, Ltd., Kokubunji, Tokyo 185, Japan
fYear :
1993
fDate :
13-16 April 1993
Keywords :
Chromium; Coercive force; Crystallization; Magnetic recording; Noise reduction; Protection; Signal to noise ratio; Sputtering; Substrates; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 1993. INTERMAG '93., Digest of International
Conference_Location :
Stockhom, Sweden
Print_ISBN :
0-7803-1310-0
Type :
conf
DOI :
10.1109/INTMAG.1993.642534
Filename :
642534
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3153794
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