• DocumentCode
    3153864
  • Title

    A FDTD method for Nonuniform Transmission Line Analysis Using Yee´s-lattice and Wavelet Expansion

  • Author

    Watanabe, Kazunori ; Sekine, Toshikazu ; Takahashi, Yasuhiro

  • Author_Institution
    Gifu Univ., Gifu
  • fYear
    2009
  • fDate
    19-20 Feb. 2009
  • Firstpage
    83
  • Lastpage
    86
  • Abstract
    A 1D finite-difference time-domain (FDTD) method for nonuniform transmission line analysis by using wavelet expansion is presented. The approach are based on scaling functions only or on a combination of scaling functions and wavelets leading to a variable mesh griding. The proposed schemes compared to the conventional Yee´s FDTD scheme shows a good capability to approximate the exact solution with negligible error for sampling rates approaching the Nyquist limit. A linear tapered transmission line that is one of models of interconnect is analyzed in order to illustrate the application of this method and to demonstrate the advantages over Yee´s FDTD scheme with respect to memory requirements and execution time. And to show the stableness, eye diagram analysis for lossy uniform transmission line is shown.
  • Keywords
    finite difference time-domain analysis; transmission line theory; 1D finite-difference time-domain method; FDTD method; Nyquist limit; Yee lattice; linear tapered transmission line; nonuniform transmission line analysis; sampling rates; wavelet expansion; Distributed parameter circuits; Equations; Finite difference methods; Integrated circuit interconnections; Propagation losses; Signal analysis; Time domain analysis; Transmission lines; Voltage; Wavelet analysis; FDTD method; nonuniform transmission line; time-domain analysis; wavelet expansion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal Integrity and High-Speed Interconnects, 2009. IMWS 2009. IEEE MTT-S International Microwave Workshop Series on
  • Conference_Location
    Guadalajara
  • Print_ISBN
    978-1-4244-2742-0
  • Electronic_ISBN
    978-1-4244-2743-7
  • Type

    conf

  • DOI
    10.1109/IMWS.2009.4814914
  • Filename
    4814914