DocumentCode
3153864
Title
A FDTD method for Nonuniform Transmission Line Analysis Using Yee´s-lattice and Wavelet Expansion
Author
Watanabe, Kazunori ; Sekine, Toshikazu ; Takahashi, Yasuhiro
Author_Institution
Gifu Univ., Gifu
fYear
2009
fDate
19-20 Feb. 2009
Firstpage
83
Lastpage
86
Abstract
A 1D finite-difference time-domain (FDTD) method for nonuniform transmission line analysis by using wavelet expansion is presented. The approach are based on scaling functions only or on a combination of scaling functions and wavelets leading to a variable mesh griding. The proposed schemes compared to the conventional Yee´s FDTD scheme shows a good capability to approximate the exact solution with negligible error for sampling rates approaching the Nyquist limit. A linear tapered transmission line that is one of models of interconnect is analyzed in order to illustrate the application of this method and to demonstrate the advantages over Yee´s FDTD scheme with respect to memory requirements and execution time. And to show the stableness, eye diagram analysis for lossy uniform transmission line is shown.
Keywords
finite difference time-domain analysis; transmission line theory; 1D finite-difference time-domain method; FDTD method; Nyquist limit; Yee lattice; linear tapered transmission line; nonuniform transmission line analysis; sampling rates; wavelet expansion; Distributed parameter circuits; Equations; Finite difference methods; Integrated circuit interconnections; Propagation losses; Signal analysis; Time domain analysis; Transmission lines; Voltage; Wavelet analysis; FDTD method; nonuniform transmission line; time-domain analysis; wavelet expansion;
fLanguage
English
Publisher
ieee
Conference_Titel
Signal Integrity and High-Speed Interconnects, 2009. IMWS 2009. IEEE MTT-S International Microwave Workshop Series on
Conference_Location
Guadalajara
Print_ISBN
978-1-4244-2742-0
Electronic_ISBN
978-1-4244-2743-7
Type
conf
DOI
10.1109/IMWS.2009.4814914
Filename
4814914
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