• DocumentCode
    3153888
  • Title

    A distance metric based outliers detection for robust Automatic Speaker Recognition applications

  • Author

    Ali, Israj ; Saha, Goutam

  • Author_Institution
    Dept. of Electron. & Electr. Commun. Eng., Indian Inst. of Technol. Kharagpur, Kharagpur, India
  • fYear
    2011
  • fDate
    16-18 Dec. 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Outlier detection in Automatic Speaker Recognition (ASR) context is a task to detect those points in feature space which are less representative of a speaker. The existence of outliers is related to handset, noise or speaker´s non-intrinsic characteristics. So detection and removal of outliers is useful in robust speaker recognition. The detection can be done in training phase or in testing phase or both. In this paper, we try to investigate the outliers in testing phase using three different distance measures with the databases, one is microphone speech, YOHO and the other is telephone speech, POLYCOST. The experiment is conducted on Mel-Frequency Cepstral Coefficients (MFCC) features with Gaussian Mixture Model (GMM) based speaker model. The results show that distance metric based outlier removal can remove maximum 29.43% of outliers in YOHO and 22.86% for POLYCOST while the accuracy improves or remain same as baseline depending on distance metric used.
  • Keywords
    Gaussian processes; cepstral analysis; microphones; speaker recognition; speech processing; GMM; Gaussian mixture model based speaker model; MFCC; Mel-frequency cepstral coefficients feature space; POLYCOST; YOHO; automatic speaker recognition; distance metric based outlier detection; microphone speech; outlier removal; telephone speech; testing phase; training phase; Accuracy; Cities and towns; Databases; Euclidean distance; Mathematical model; Speaker recognition; City Block Distance; Euclidean Distance; Minkowski Distance; Outliers; Speaker Recognition;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    India Conference (INDICON), 2011 Annual IEEE
  • Conference_Location
    Hyderabad
  • Print_ISBN
    978-1-4577-1110-7
  • Type

    conf

  • DOI
    10.1109/INDCON.2011.6139358
  • Filename
    6139358