DocumentCode :
3154062
Title :
Low intensity low temperature (LILT) measurements and coefficients on new photovoltaic structures
Author :
Jenkins, Phillip P. ; Scheiman, David A. ; Brinker, David J. ; Appelbaum, Joseph
Author_Institution :
NYMA Inc., Brook Park, OH, USA
fYear :
1996
fDate :
13-17 May 1996
Firstpage :
317
Lastpage :
320
Abstract :
As RTGs have become increasingly less desirable for outer-planetary missions, solar cell performance data at very low temperatures and intensities are required. The authors have measured low intensity, low temperature (LILT) I-V data on single junction and multi-junction high efficiency solar cells, representing the state-of-the-art in photovoltaic technology. Using this LILT data to calculate Isc, Voc, and FF as a function of temperature and intensity, an accurate prediction of cell performance under the AMO spectrum can be determined. When combined with quantum efficiency at low temperature (QULT) data, one can further enhance the prediction by the addition of spectral variation. This paper presents an overview of LILT measurements taken at temperatures as low as -180°C and intensities ranging from 1 Sun to 0.02 Suns. The temperature dependency coefficients presented in this paper are experimental results intended to provide a guideline for array design
Keywords :
aerospace testing; cryogenic electronics; electric current measurement; photovoltaic power systems; semiconductor device testing; solar cell arrays; solar cells; space vehicle power plants; thermal analysis; voltage measurement; I-V data; LILT studies; fill factor; low intensity low temperature measurements; open-circuit voltage; photovoltaic technology; quantum efficiency; short-circuit current; solar cell array design; solar cell performance data; space power solar cells; spectral variation; state-of-the-art; temperature dependency coefficients; Extraterrestrial measurements; Gallium arsenide; Indium phosphide; Photonic band gap; Photovoltaic cells; Photovoltaic systems; Planets; Solar power generation; Sun; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
Conference_Location :
Washington, DC
ISSN :
0160-8371
Print_ISBN :
0-7803-3166-4
Type :
conf
DOI :
10.1109/PVSC.1996.564009
Filename :
564009
Link To Document :
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