Title :
Seeing through the expression: Bridging the gap between expression and emotion recognition
Author :
Lun-Kai Hsu ; Wen-Sheng Tseng ; Li-Wei Kang ; Wang, Yu-Chiang Frank
Author_Institution :
Dept. Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Abstract :
In this paper, we propose a novel approach for visualizing and recognizing different emotion categories using facial expression images. Extended by the unsupervised nonlinear dimension reduction technique of locally linear embedding (LLE), we propose a supervised LLE (sLLE) algorithm utilizing emotion labels of face expression images. While existing works typically aim at training on such labeled data for emotion recognition, our approach allows one to derive subspaces for visualizing facial expression images within and across different emotion categories, and thus emotion recognition can be properly performed. In our work, we relate the resulting two-dimensional subspace to the valence-arousal emotion space, in which our method is observed to automatically identify and discriminate emotions in different degrees. Experimental results on two facial emotion datasets verify the effectiveness of our algorithm. With reduced numbers of feature dimensions (2D or beyond), our approach is shown to achieve promising emotion recognition performance.
Keywords :
data visualisation; emotion recognition; face recognition; learning (artificial intelligence); automatic emotion discrimination; automatic emotion identification; emotion categories; emotion labels; emotion recognition; emotion visualization; facial emotion datasets; facial expression image recognition; facial expression image visualization; feature dimensions; locally linear embedding algorithm; sLLE algorithm; supervised LLE algorithm; two-dimensional subspace; unsupervised nonlinear dimension reduction technique; valence-arousal emotion space; Abstracts; Ear; Support vector machines; Training; Expression recognition; emotion recognition; subspace learning;
Conference_Titel :
Multimedia and Expo (ICME), 2013 IEEE International Conference on
Conference_Location :
San Jose, CA
DOI :
10.1109/ICME.2013.6607638