Title :
New Approach To Large Current Printed Circuit Boards(LC-PCB) With Attaching Bus-bars By Caulking Fasteners
Author :
Sunamoto, Masatoshi ; Adachi, Einosuke ; Kitamura, Yoshifumi ; Nishikawa, Tetsuya ; Hatanaka, Yasumichi
Keywords :
Birth disorders; Circuit testing; Compressive stress; Copper; Creep; Fasteners; Joining processes; Manufacturing; Printed circuits; Wiring;
Conference_Titel :
IEMT/IMC Symposium, 1997., 1st [Joint International Electronic Manufacturing Symposium and the International Microelectronics Conference]
Conference_Location :
IEEE
Print_ISBN :
0-7803-4235-6
