Title : 
Modeling of printed periodic structures with thick metal patches by the MoM/BI-RME method
         
        
            Author : 
Bozzi, Maurizio ; Montagna, Maria ; Perregrini, Luca
         
        
            Author_Institution : 
Dept. of Electron., Univ. of Pavia, Pavia, Italy
         
        
        
        
        
        
            Abstract : 
This paper presents a novel technique for the accurate modeling of printed periodic structures with thick metal patches. These structures include capacitive frequency selective surfaces (FSS) and metallo-dielectric electromagnetic band-gap (EBG) structures, and are typically modeled under the hypothesis of infinitely thin metal patches. Nevertheless, taking into account the finite thickness of the patches allows for a more accurate modeling, especially at mm-wave frequency, as well as for a better evaluation of conductor losses. The analysis technique proposed in this paper is based on the MoM/BI-RME method and permits to obtain an accurate and computationally efficient modeling tool. A validation example is reported in the case of a capacitive FSS and is compared to the results obtained with a commercial full-wave electromagnetic software.
         
        
            Keywords : 
frequency selective surfaces; photonic band gap; MoM/BI-RME method; capacitive frequency selective surfaces; conductor losses; full-wave electromagnetic software; metallo-dielectric electromagnetic band-gap structures; printed periodic structures; thick metal patches; thin metal patches; Computational modeling; Conductors; Dielectric substrates; Electromagnetic modeling; Frequency selective surfaces; Geometry; Integral equations; Metamaterials; Periodic structures; Planar arrays; Periodic structures; electromagnetic band-gap structures; frequency selective surfaces; integral-equation method;
         
        
        
        
            Conference_Titel : 
Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
         
        
            Conference_Location : 
Anaheim, CA
         
        
        
            Print_ISBN : 
978-1-4244-6056-4
         
        
            Electronic_ISBN : 
0149-645X
         
        
        
            DOI : 
10.1109/MWSYM.2010.5518166