• DocumentCode
    3154637
  • Title

    Robust Test Generation Algorithm for Stuck-Open Fault in CMOS Circuits

  • Author

    Weiwei, Mao ; Xieting, Ling

  • Author_Institution
    Electronic Engineering Department, Fudan University, Shanghai, People´´s Republic of China
  • fYear
    1986
  • fDate
    29-2 June 1986
  • Firstpage
    236
  • Lastpage
    242
  • Abstract
    A test generation algorithm for stuck-open faults in CMOS combinational circuits is presented in the paper. A two pattern test, e.g., an initializing input pattern T1 and a test input pattern T2 can be generated at the same time. It is shown that the test {T1,T2} generated using the algorithm is a robust test.
  • Keywords
    Circuit faults; Circuit testing; Combinational circuits; Electronic equipment testing; Equivalent circuits; FETs; Integrated circuit interconnections; Logic; Robustness; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation, 1986. 23rd Conference on
  • ISSN
    0738-100X
  • Print_ISBN
    0-8186-0702-5
  • Type

    conf

  • DOI
    10.1109/DAC.1986.1586095
  • Filename
    1586095
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3154637