Title :
Design-for-Testability of PLA´S Using Statistical Cooling
Author :
Ligthart, Michiel M. ; Aarts, Emile H L ; Beenker, Frans P M
Author_Institution :
Philips Research Laboratories, Eindhoven, the Netherlands
Abstract :
A method for designing easily testable PLA´s with low overhead is presented. The method is based on a reduction of product lines and the addition of a small number of inputs. The required additional hardware is calculated using a statistical cooling algorithm. The presented design-for-testability method guarantees a 100 percent fault coverage with respect to multiple stuck-at faults and multiple missing/extra crosspoint faults.
Keywords :
PLA; PLA testing; design-for-testability; statistical cooling; Boolean functions; Circuit faults; Circuit testing; Cooling; Design methodology; Hardware; Logic design; Logic testing; Programmable logic arrays; Shift registers; PLA; PLA testing; design-for-testability; statistical cooling;
Conference_Titel :
Design Automation, 1986. 23rd Conference on
Print_ISBN :
0-8186-0702-5
DOI :
10.1109/DAC.1986.1586110
