DocumentCode
3155004
Title
Automatic Generation of Self-Test Programs - A New Feature of the MIMOLA Design System
Author
Krüger, Gerd
Author_Institution
Institut fur Informatik u. Prakt. Math., Universitat Kiel, Kiel, W. Germany
fYear
1986
fDate
29-2 June 1986
Firstpage
378
Lastpage
384
Abstract
A method to automatically generate functional self-test programs for arbitrary processor systems including microprogrammable and custom designed special purpose types is presented. Only commonly available user information is needed, but gate-level details can be utilized as well. The generated self-test programs perform user guided tests for memory function and register decoding, functional or gate-level derived tests for combinational modules, and a machine status check to detect undesired side-effects. The programs are given in the micro- or machine code of the target system, ready for execution. First applications have shown promising results.
Keywords
Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Hardware; Microprogramming; Registers; Software systems; Software testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation, 1986. 23rd Conference on
ISSN
0738-100X
Print_ISBN
0-8186-0702-5
Type
conf
DOI
10.1109/DAC.1986.1586117
Filename
1586117
Link To Document