• DocumentCode
    3155004
  • Title

    Automatic Generation of Self-Test Programs - A New Feature of the MIMOLA Design System

  • Author

    Krüger, Gerd

  • Author_Institution
    Institut fur Informatik u. Prakt. Math., Universitat Kiel, Kiel, W. Germany
  • fYear
    1986
  • fDate
    29-2 June 1986
  • Firstpage
    378
  • Lastpage
    384
  • Abstract
    A method to automatically generate functional self-test programs for arbitrary processor systems including microprogrammable and custom designed special purpose types is presented. Only commonly available user information is needed, but gate-level details can be utilized as well. The generated self-test programs perform user guided tests for memory function and register decoding, functional or gate-level derived tests for combinational modules, and a machine status check to detect undesired side-effects. The programs are given in the micro- or machine code of the target system, ready for execution. First applications have shown promising results.
  • Keywords
    Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Hardware; Microprogramming; Registers; Software systems; Software testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation, 1986. 23rd Conference on
  • ISSN
    0738-100X
  • Print_ISBN
    0-8186-0702-5
  • Type

    conf

  • DOI
    10.1109/DAC.1986.1586117
  • Filename
    1586117