Title :
Fault detection with an adaptive distance for the k-Nearest neighbors rule
Author :
Verdier, Ghislain ; Ferreira, Ariane
Author_Institution :
Centre de Microelectron. de Provence, Ecole Nat. Super. des Mines de St.-Etienne, Gardanne, France
Abstract :
In recent years, fault detection has become a crucial issue for many industrial fields, notably the semiconductor manufacturing where process control engineers constantly try to improve the equipment productivity by detecting as quickly as possible an abnormal behavior. Due to the number of variables and the correlations between them in this type of applications, statistical methods dealing with fault detection need to be multivariate. Usually, the multivariate control chart procedures used in the industry derived from the Hotelling T2. However, this rule can only be used when the observations are generated by a Gaussian distribution, an assumption rarely satisfied in practice. An alternative consists to apply nonparametric control charts for which there is no assumption needed on the distribution. A nonparametric rule, the k-Nearest Neighbors Detection rule is studied in this paper. The approach consists in evaluating the distance of an observation to its nearest neighbors and declaring a fault if this distance is too large. In this paper, a new adaptive Mahalanobis distance is proposed. It takes into account the local correlation structure of the data and then improves the number of faults detected for a fixed false alarm rate, compared to a classic distance such as the Euclidean distance.
Keywords :
control charts; fault diagnosis; semiconductor industry; statistical analysis; statistical process control; Gaussian distribution; Hotelling rule; abnormal behavior detection; adaptive Mahalanobis distance; equipment productivity; fault detection; fixed false alarm rate; k-nearest neighbors detection rule; multivariate control chart procedures; process control engineers; semiconductor manufacturing; statistical methods; Control charts; Fault detection; Gaussian distribution; Industrial control; Manufacturing industries; Manufacturing processes; Process control; Productivity; Semiconductor device manufacture; Statistical analysis; Adaptive Mahalanobis distance; Correlated variables; Hotelling T2; Multivariate methods; Statistical fault detection; k-Nearest Neighbors rule;
Conference_Titel :
Computers & Industrial Engineering, 2009. CIE 2009. International Conference on
Conference_Location :
Troyes
Print_ISBN :
978-1-4244-4135-8
Electronic_ISBN :
978-1-4244-4136-5
DOI :
10.1109/ICCIE.2009.5223844