• DocumentCode
    3155124
  • Title

    A new extraction method for the characteristic impedance and effective dielectric constant of transmission line with DGS

  • Author

    Kang, Minwoo ; Park, Sunju ; Kim, Kwisoo ; Han, Sang-Min ; Lim, Jongsik ; Choi, Kwansun ; Ahn, Dal

  • Author_Institution
    Dept. of Electr. Commun. Syst. Eng., Soonchunhyang Univ., Asan, South Korea
  • fYear
    2009
  • fDate
    Jan. 9 2009-Dec. 11 2009
  • Firstpage
    265
  • Lastpage
    268
  • Abstract
    In this paper, we propose a new extraction method for the characteristic impedance and effective dielectric constant of a microstrip line. It extracts the characteristic impedance and effective dielectric constant of a microstrip line that uses the results of S-parameters through the EM-simulation. And it also extracts the characteristic impedance and effective dielectric constant of microstrip line with DGS and compare the variation of frequency response. We simulate a microstrip line which has a dumbbell type DGS, and extract the electrical length, characteristic impedance and effective dielectric constant according to the DGS´s size and the number of DGS. From these results, we analyze how DGS influence the variation of the transmission line characteristics such as the characteristic impedance and effective dielectric constant of a microstrip line.
  • Keywords
    S-parameters; defected ground structures; microstrip lines; permittivity; transmission lines; EM-simulation; S-parameter; characteristic impedance; defected ground structure; dielectric constant; dumbbell type DGS; extraction method; microstrip line; transmission line; Admittance; Clocks; Dielectric constant; Distributed parameter circuits; Frequency response; Impedance; Microstrip; Radio frequency; Systems engineering and theory; Transmission lines; DGS (Defected Ground Structure); Microstrip line; S-Parameter; characteristic impedance; effective dielectric constant; electrical length;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio-Frequency Integration Technology, 2009. RFIT 2009. IEEE International Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-5031-2
  • Electronic_ISBN
    978-1-4244-5032-9
  • Type

    conf

  • DOI
    10.1109/RFIT.2009.5383712
  • Filename
    5383712