Title :
Effectiveness of Heuristics Measures for Automatic Test Pattern Generation
Author :
Patel, Surabhi ; Pate, Janak
Author_Institution :
International Business Machines Corporation, Poughkeepsie, NY
Abstract :
The PODEM (path-oriented decision making) algorithm generates tests for single stuck-at faults in combinational circuits described at the gate level. Controllability and observability (C/O) values were used as heuristic measures in PODEM. The PODEM algorithm and five different methods of determining controllability and observability were implemented. An experiment was conducted to study the effectiveness of different controllability and observability measures for PODEM. Based on the experimental data a new strategy for test generation is discussed.
Keywords :
Automatic test pattern generation; Circuit faults; Circuit testing; Combinational circuits; Controllability; Decision making; Logic; Observability; Random number generation; Sequential analysis;
Conference_Titel :
Design Automation, 1986. 23rd Conference on
Print_ISBN :
0-8186-0702-5
DOI :
10.1109/DAC.1986.1586141
