• DocumentCode
    3155513
  • Title

    Investigation of CMOS on-chip transmission lines CPW, SCPW and CPWG up to 110GHz

  • Author

    Shi, Jinglin ; Kang, Kai ; Xiong, Yong Zhong ; Lin, Fujiang

  • Author_Institution
    Inst. of Microelectron., A*STAR (Agency for Sci., Technol. & Res.), Singapore, Singapore
  • fYear
    2009
  • fDate
    Jan. 9 2009-Dec. 11 2009
  • Firstpage
    269
  • Lastpage
    272
  • Abstract
    On-chip transmission lines are basic components in millimeter-wave and terahertz circuits. As the frequency goes up, the transmission lines are more and more important to determine the performance of the circuits. In this paper, CPW, slow wave CPW (SCPW) with different shielding layers and CPWG fabricated in a commercial 0.18 ¿m CMOS process have been characterized and analyzed. Based on measured two-port S-parameters up to 110 GHz, the attenuation and phase constants are compared. The relative dielectric permittivity is extracted and the relation with the reverse of the distance is shown which provides the hint for the choice of the shielding layers. However, the application frequency should be considered due to the attenuation is strongly frequency dependent.
  • Keywords
    CMOS integrated circuits; S-parameters; coplanar waveguides; millimetre wave integrated circuits; transmission lines; CMOS on-chip transmission lines; millimeter-wave circuits; relative dielectric permittivity; size 0.18 mum; slow wave CPW; terahertz circuits; two-port S-parameters; Attenuation measurement; CMOS process; Coplanar waveguides; Dielectric measurements; Distributed parameter circuits; Frequency; Millimeter wave circuits; Permittivity measurement; Transmission line measurements; Transmission lines; CMOS; CPW; CPWG; SCPW; on-chip transmission line; on-wafer measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio-Frequency Integration Technology, 2009. RFIT 2009. IEEE International Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-5031-2
  • Electronic_ISBN
    978-1-4244-5032-9
  • Type

    conf

  • DOI
    10.1109/RFIT.2009.5383732
  • Filename
    5383732