Title :
A 4-octave tuning range integer-/fractional-N synthesizer for low phase noise space applications
Author :
Leineweber, Thomas ; Henkel, Frank ; Steinkamp, Jan ; Dallüge, Lutz ; Waldow, Peter ; Thornber, Martin
Author_Institution :
IMST GmbH, Kamp-Lintfort, Germany
fDate :
Jan. 9 2009-Dec. 11 2009
Abstract :
In this paper a low phase noise frequency synthesizer is presented which includes a fully integrated VCO system achieving a 4 octave tuning range between 220-3500MHz. Further, the phase locked loop (PLL) offers various configuration modes to flexibly support different applications with a single chip containing PLL and VCO. The PLL can operate in fractional- and integer-N mode. For the potential use in space missions the IC has been fabricated on a radiation hard process. The synthesizer architecture is discussed and details about selected building blocks are given. The paper concludes with a measured performance summary, which shows achieved values for the normalized inband PLL phase noise floor as low as -221dBc/Hz. This very low phase noise has been achieved despite the mature process and the applied derating rules.
Keywords :
frequency synthesizers; integrated circuit manufacture; phase locked loops; phase noise; radiation hardening (electronics); space communication links; voltage-controlled oscillators; IC fabrication; configuration modes; fractional-N synthesizer; frequency 220 MHz to 3500 MHz; fully integrated VCO system; low phase noise frequency synthesizer; low phase noise space applications; phase locked loop; radiation hard process; space missions; synthesizer architecture; tuning range integer; Floors; Frequency synthesizers; Noise measurement; Phase locked loops; Phase measurement; Phase noise; Semiconductor device measurement; Space missions; Tuning; Voltage-controlled oscillators; BiCMOS integrated circuits; Frac-N; Frequency synthesizers; Oscillators; Phase detection; Phase locked loops; Phase noise; Sigma-delta modulation;
Conference_Titel :
Radio-Frequency Integration Technology, 2009. RFIT 2009. IEEE International Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-5031-2
Electronic_ISBN :
978-1-4244-5032-9
DOI :
10.1109/RFIT.2009.5383739