Title :
Estimating and controlling chromatic aberration losses for two-junction, two-terminal devices in refractive concentrator systems
Author :
Kurtz, Sarah R. ; O´Neill, Mark J.
Author_Institution :
Nat. Renewable Energy Lab., Golden, CO, USA
Abstract :
Although previous studies have measured and calculated solar cell chromatic aberration losses and proposed methods for reducing these by modifying the optics, significant work remains to be done toward understanding how to quantify the losses and how various parameters affect this loss. This paper presents an analytical definition and calculation method for chromatic aberration losses in Ga0.5In 0.5P/GaAs solar cells. The effects of sheet resistance of the midlayers of the cell, total irradiance, incident spectrum, cell width and diode quality factor are studied. A method for measuring the midlayer resistance in finished solar cells is also described
Keywords :
III-V semiconductors; aberrations; electric resistance measurement; gallium arsenide; gallium compounds; indium compounds; optical losses; p-n heterojunctions; semiconductor device models; semiconductor device testing; solar cells; solar energy concentrators; Ga0.5In0.5P/GaAs solar cells; GaInP-GaAs; cell width; chromatic aberration losses; diode quality factor; incident spectrum; midlayer resistance measurement; optical loss estimation; refractive concentrator solar cells; sheet resistance; total irradiance; two-junction two-terminal PV cells; Diodes; Energy measurement; Joining processes; Laboratories; Optical losses; Optical refraction; Renewable energy resources; Resistors; Space technology; Voltage;
Conference_Titel :
Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-3166-4
DOI :
10.1109/PVSC.1996.564020
