Title :
RF performance analysis of single- and multi-wall carbon nanotube interconnect
Author :
Das, Debaprasad ; Rahaman, Hafizur
Author_Institution :
Sch. of VLSI Technol., Bengal Eng. & Sci. Univ., Shibpur, India
Abstract :
The work in this paper analyzes the applicability of carbon nanotube (CNT) as the interconnect for radio-frequency (RF) VLSI circuits. An RF model is developed by calculating the frequency dependent circuit parameters based on interconnect geometry. Using the developed model the RF performance of CNT based interconnects is investigated and compared to that of copper based interconnects for future technology nodes. It is shown that CNT based interconnect is capable of operating up to THz frequency range for shorter interconnect length.
Keywords :
VLSI; carbon nanotubes; geometry; integrated circuit interconnections; radiofrequency integrated circuits; CNT; RF VLSI circuit; RF performance analysis; THz frequency range; copper based interconnection; frequency dependent circuit parameter calculation; interconnect geometry; multiwall carbon nanotube interconnection; radiofrequency VLSI circuit; shorter interconnect length; single-wall carbon nanotube interconnection; Analytical models; Carbon nanotubes; Copper; Integrated circuit interconnections; Integrated circuit modeling; Radio frequency; Very large scale integration; Carbon Nanotube (CNT); Multi-Wall CNT (MWCNT); Radio Frequency (RF); Single-wall CNT (SWCNT); Very Large Scale Integration (VLSI);
Conference_Titel :
India Conference (INDICON), 2011 Annual IEEE
Conference_Location :
Hyderabad
Print_ISBN :
978-1-4577-1110-7
DOI :
10.1109/INDCON.2011.6139457