• DocumentCode
    3155922
  • Title

    Reliability distribution of ADB610 steel impact toughness after strain aging

  • Author

    Ma, Yanhui ; Yu, Jiwen ; Zhang, Tianhui ; Xu, Renping

  • Author_Institution
    Yunnan Vocational Coll. of Machinary & Electr. Technol., Kunming, China
  • fYear
    2011
  • fDate
    16-18 April 2011
  • Firstpage
    2447
  • Lastpage
    2450
  • Abstract
    Reliability distribution for impact toughness after strain aging of 38 mm thick ADB610 steel was investigated. The reliability distribution model was established by using least square method and correlation coefficent maximization method. Then the hypothesis test was calculated by using correlation coefficent test and K-S test method. It can be concluded that the impact toughness after strain aging of 38 mm ADB610 steel obeys Normal distribution, Lognormal distribution, 2-Weibull distribution and 3-Weibull distribution, and Lognormal distribution is the best. The confidence interval of 38 mm ADB610 steel impact toughness after strain aging was investigated, and the security impact toughness after strain aging is calculated to be [211.5, 219.3], [202.5, 213] and [186.6, 201.6] J based on 95% confidence level and 90%, 95% and 99% reliability.
  • Keywords
    Weibull distribution; fracture toughness; least squares approximations; mechanical testing; normal distribution; optimisation; reliability; steel; strain ageing; ADB610 steel; K-S test method; Weibull distribution; confidence interval; correlation coefficent maximization method; correlation coefficent test; hypothesis test; impact toughness; least square method; lognormal distribution; normal distribution; reliability distribution model; size 38 mm; strain aging; ADB610 steel; impact toughness after strain aging; reliability distribution; security impact toughness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Consumer Electronics, Communications and Networks (CECNet), 2011 International Conference on
  • Conference_Location
    XianNing
  • Print_ISBN
    978-1-61284-458-9
  • Type

    conf

  • DOI
    10.1109/CECNET.2011.5768622
  • Filename
    5768622