Title :
Data model for product life cycle quality control mapping with product structure geometrical model
Author :
Jihong, Shan ; Yalang, Mao ; Yi, Sun
Author_Institution :
Key Lab. of Minist. of Educ., Zhejiang Univ. of Technol., Hangzhou, China
Abstract :
This paper focus on the technique of learning the knowledge on the design quality and manufacture quality. The characteristic of quality control are illustrated, such as status, process, structure etc, and a lot of feature of the quality control information which consist of geometrical structure model, manufacture technique, detect, fault diagnose and data analysis were presented. Then an approach of the mapping between the product quality control information to the components geometrical model is put out, which can be implemented to optimal the product design, manufacture and assembly in quality control. Finally a prototype system was designed based on the data model.
Keywords :
assembling; data analysis; data models; design for quality; fault diagnosis; product life cycle management; production engineering computing; quality control; assembly; data analysis; data model; design quality; fault diagnose detection; manufacture quality; manufacture technique; product design; product life cycle quality control mapping; product structure geometrical model; Data models; Design automation; Product design; Quality control; Solid modeling; Sun; Unified modeling language; data model; quality control; structure mapping model;
Conference_Titel :
Consumer Electronics, Communications and Networks (CECNet), 2011 International Conference on
Conference_Location :
XianNing
Print_ISBN :
978-1-61284-458-9
DOI :
10.1109/CECNET.2011.5768635