DocumentCode :
3156435
Title :
Sub-micron filamentary structures formed during light induced frustrated etching of fe-doped lithium niobate: results and modelling
Author :
Scott, Jeffrey G. ; Boyland, Alexander J. ; Eason, Robert W.
Author_Institution :
University of Southampton
fYear :
2003
fDate :
22-27 June 2003
Firstpage :
342
Lastpage :
342
Keywords :
Bragg gratings; Electrooptic devices; Etching; Fourier transforms; Lithium niobate; Nonlinear optical devices; Nonlinear optics; Optical materials; Photorefractive materials; Scanning electron microscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Europe, 2003. CLEO/Europe. 2003 Conference on
Print_ISBN :
0-7803-7734-6
Type :
conf
DOI :
10.1109/CLEOE.2003.1312403
Filename :
1312403
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3156435
بازگشت