• DocumentCode
    3156435
  • Title

    Sub-micron filamentary structures formed during light induced frustrated etching of fe-doped lithium niobate: results and modelling

  • Author

    Scott, Jeffrey G. ; Boyland, Alexander J. ; Eason, Robert W.

  • Author_Institution
    University of Southampton
  • fYear
    2003
  • fDate
    22-27 June 2003
  • Firstpage
    342
  • Lastpage
    342
  • Keywords
    Bragg gratings; Electrooptic devices; Etching; Fourier transforms; Lithium niobate; Nonlinear optical devices; Nonlinear optics; Optical materials; Photorefractive materials; Scanning electron microscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Europe, 2003. CLEO/Europe. 2003 Conference on
  • Print_ISBN
    0-7803-7734-6
  • Type

    conf

  • DOI
    10.1109/CLEOE.2003.1312403
  • Filename
    1312403
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3156435