DocumentCode :
3156492
Title :
Asymptotic predictions of the finite-sample risk of the k-nearest-neighbor classifier
Author :
Snapp, Robert R. ; Venkatesh, Santosh S.
Author_Institution :
Dept. of Comput. Sci. & Electr. Eng., Vermont Univ., Burlington, VT, USA
Volume :
2
fYear :
1994
fDate :
9-13 Oct 1994
Firstpage :
1
Abstract :
The finite-sample risk of the k-nearest-neighbor classifier is analyzed for a family of two-class problems in which patterns are randomly generated from smooth probability distributions in an n-dimensional Euclidean feature space. First, an exact integral expression for the m-sample risk is obtained for a k-nearest-neighbor classifier that uses a reference sample of m labeled feature vectors. Using a multidimensional application of Laplace´s method of integration, this integral can be represented as an asymptotic expansion in negative rational powers of m. The leading terms of this asymptotic expansion elucidate the curse of dimensionality and other properties of the finite-sample risk
Keywords :
pattern classification; Euclidean feature space; Laplace´s method; asymptotic predictions; feature vectors; finite-sample risk; k-nearest-neighbor classifier; pattern classification; probability distributions; two-class problems; Computer science; Convergence; Extraterrestrial measurements; Multidimensional systems; Pattern analysis; Pattern recognition; Performance analysis; Probability distribution; Risk analysis; Yield estimation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition, 1994. Vol. 2 - Conference B: Computer Vision & Image Processing., Proceedings of the 12th IAPR International. Conference on
Conference_Location :
Jerusalem
Print_ISBN :
0-8186-6270-0
Type :
conf
DOI :
10.1109/ICPR.1994.576865
Filename :
576865
Link To Document :
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