DocumentCode :
3156814
Title :
Inference using phi-divergence Goodness-of-Fit tests
Author :
Kundargi, Nikhil ; Tewfik, Ahmed
Author_Institution :
Univ. of Texas at Austin, Austin, TX, USA
fYear :
2012
fDate :
25-30 March 2012
Firstpage :
3001
Lastpage :
3004
Abstract :
In this paper we study the inferential use of goodness of fit tests in a non-parametric setting. The utility of such tests will be demonstrated for the test case of spectrum sensing applications in cognitive radios. For the first time, we provide a comprehensive framework for decision fusion of a ensemble of goodness-of-fit testing procedures through an Ensemble Goodness-of-Fit test. Also, we introduce a generalized family of functionals and kernels called Φ-divergences which allow us to formulate goodness-of-fit tests that are parameterized by a single parameter s. The performance of these tests is simulated under gaussian and non-gaussian noise in a MIMO setting. We show that under uncertainty or non-gaussianity in the noise, the performance of non-parametric tests in general, and phi-divergence based goodness-of-fit tests in particular, is significantly superior to that of the energy detector with reduced implementation complexity. Especially important is the property that the false alarm rates of our proposed tests is maintained at a fixed level over a wide variation in the channel noise distributions.
Keywords :
Gaussian noise; cognitive radio; computational complexity; signal detection; Gaussian noise; MIMO setting; channel noise distribution; cognitive radios; decision fusion; energy detector; ensemble goodness-of-fit test; implementation complexity reduction; nonGaussian noise; phi-divergence goodness-of-fit tests; spectrum sensing applications; Cognitive radio; Gaussian noise; Robustness; Sensors; Signal to noise ratio; Testing; Decision Fusion; Ensemble Tests; Goodness of Fit tests; Non parametric Inference; Phi Divergence; Spectrum Sensing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Acoustics, Speech and Signal Processing (ICASSP), 2012 IEEE International Conference on
Conference_Location :
Kyoto
ISSN :
1520-6149
Print_ISBN :
978-1-4673-0045-2
Electronic_ISBN :
1520-6149
Type :
conf
DOI :
10.1109/ICASSP.2012.6288546
Filename :
6288546
Link To Document :
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