DocumentCode
3157295
Title
Elimination of parasitic effects in floating junction rear surface passivation for solar cells
Author
Honsberg, C.B. ; Ghozati, SIB ; Ebong, A.U. ; Tang, Y.-H. ; Wenham, S.R.
Author_Institution
New South Wales Univ., Kensington, NSW, Australia
fYear
1996
fDate
13-17 May 1996
Firstpage
401
Lastpage
404
Abstract
Floating junction (FJ) passivation is a relatively recent passivation scheme which has both experimentally and theoretically demonstrated superior passivation than either oxide or back surface field passivation. In addition, it is suited not only to high efficiency laboratory cells, but also to commercial solar cells. The improvement in surface passivation for commercial cells is an especially critical issue in achieving lower cost solar cells through reducing substrate thickness while simultaneously increasing efficiency. Despite the many advantages of FJ passivation, its applicability has been limited by the apparent inability to translate the excellent modelling results into actual solar cells. The objective of this paper is to present a complete analysis of FJ passivation and to demonstrate a method by which the problems with FJ passivation can be eliminated. Experimental evidence as well as theoretical modelling demonstrates that a solar cell with an optimized rear FJ is insensitive to parasitic effects
Keywords
p-n junctions; passivation; semiconductor device models; semiconductor device testing; solar cells; commercial solar cells; floating junction rear surface passivation; laboratory solar cells; modelling results; parasitic effects elimination; shunt effects minimisation; substrate thickness; test results; Australia; Circuits; Costs; Doping; Laboratories; Passivation; Photovoltaic cells; Semiconductor device modeling; Semiconductor process modeling; Solar power generation;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
Conference_Location
Washington, DC
ISSN
0160-8371
Print_ISBN
0-7803-3166-4
Type
conf
DOI
10.1109/PVSC.1996.564028
Filename
564028
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