• DocumentCode
    3157520
  • Title

    Analytical Solution in Complicated Volumes for Detailed Compact Thermal Model Construction

  • Author

    Batty, W.

  • Author_Institution
    Filtronic Compound Semicond. Ltd., Newton Aycliffe, Co., Durham
  • fYear
    2006
  • fDate
    10-13 Sept. 2006
  • Firstpage
    316
  • Lastpage
    319
  • Abstract
    Original recursive construction and series acceleration techniques are presented for an analytically exact solution of temperature response at any point in an arbitrary N-level, finite, rectangular multi-layer. This enhanced solution is fast and robust and provides accurate calculation of thermal resistance for packaged and mounted power FETs and MMICs. The model is validated against liquid crystal measurements. It forms the basis for quasi-analytical construction of the global thermal impedance matrix for complicated microwave systems by spectral, domain decomposition. Construction costs can be O(I), where I is the number of subvolume heating and interface elements. An original recursive convolution technique is presented producing transient simulation after pre-computation at O(N) cost, where N is the number of time steps. The method is illustrated by simulation of a mounted, packaged and metallised FET. This represents the most detailed quasi-analytical thermal simulation ever presented. This generalised network parameter description provides immediately boundary condition independent (BCI) compact dynamic thermal models for electrothermal CAD
  • Keywords
    CAD; MMIC; field effect transistors; network parameters; thermal resistance; FET; MMIC; arbitrary N-level; boundary condition independent; compact thermal model construction; complicated volumes; electrothermal CAD; global thermal impedance matrix; network parameter description; quasianalytical construction; quasianalytical thermal simulation; temperature response; thermal resistance; Acceleration; Costs; FETs; Liquid crystals; MMICs; Packaging; Power system modeling; Robustness; Temperature; Thermal resistance; MMICs; Modeling; circuit simulation; design automation; electrothermal effects; microwave circuits; power transistors; reduced order systems; thermal factors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    European Microwave Integrated Circuits Conference, 2006. The 1st
  • Conference_Location
    Manchester
  • Print_ISBN
    2-9600551-8-7
  • Type

    conf

  • DOI
    10.1109/EMICC.2006.282816
  • Filename
    4057639