Title :
Thermodynamic validity of noise models for nonlinear resistive devices
Author :
Wyatt, John L. ; Coram, Geoffrey J.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., MIT, Cambridge, MA, USA
Abstract :
The first result of this paper gives the shot-noise amplitude for a class of nonlinear resistances. The noise behavior for equilibrium and nonequilibrium bias conditions is uniquely specified by the voltage-current relation and thermodynamic constraints. Secondly, we show that the Gaussian model cannot be applied to any nonlinear device. While the Gaussian model can be a useful approximation, it cannot be physically correct
Keywords :
equivalent circuits; semiconductor device models; semiconductor device noise; shot noise; Gaussian model; equilibrium bias conditions; noise models; nonequilibrium bias conditions; nonlinear resistances; nonlinear resistive devices; shot-noise amplitude; thermodynamic validity; voltage-current relation; Capacitors; Circuit noise; Electrons; Gaussian noise; Laboratories; Noise level; Power system modeling; Random processes; Thermodynamics; Voltage;
Conference_Titel :
Circuits and Systems, 1997. ISCAS '97., Proceedings of 1997 IEEE International Symposium on
Print_ISBN :
0-7803-3583-X
DOI :
10.1109/ISCAS.1997.621856
