DocumentCode
3157831
Title
Mechanisms controlling phase formation in PZT thin films
Author
Majumder, S.B. ; Agrawal, D.C. ; Mohapatra, Y.N. ; Kulkarni, V.N.
Author_Institution
Mater. Sci. Programme, Indian Inst. of Technol., Kanpur, India
fYear
1991
fDate
33457
Firstpage
454
Lastpage
456
Abstract
Factors controlling the formation of the perovskite phase in sol-gel prepared PZT film were studied. Perovskite was found to form quite easily, even in very thin films on sapphire, polycrystalline Al 2O3 and NaCl but only in relatively thick films on quartz, glass and Si. Formation of the perovskite phase is also favoured in (a) films with low Zr/Ti ratio and high Pb content, (b) films heated rapidly to annealing temperature and (c) films annealed in N2 ambient. RBS studies show that large deficiency of Pb develops in films which remain in the pyrochlore structure due to reaction at the interface or due to diffusion into the interface. The initial transformation from amorphous to pyrochlore is believed to be due to enhanced strain energy barrier for the amorphous→perovskite transformation
Keywords
Rutherford backscattering; annealing; crystal structure; crystallisation; ferroelectric materials; ferroelectric thin films; lead compounds; sol-gel processing; solid-state phase transformations; Al2O3; NaCl; PZT; PZT thin films; PbZrO3TiO3; RBS; Si; SiO2; amorphous to pyrochlore transition; annealing temperature; enhanced strain energy barrier; high Pb content; low Zr/Ti ratio; perovskite phase; phase formation; pyrochlore structure; sol-gel prepared film; Amorphous materials; Annealing; Capacitive sensors; Glass; Semiconductor films; Semiconductor thin films; Temperature; Thick films; Transistors; Zirconium;
fLanguage
English
Publisher
ieee
Conference_Titel
Applications of Ferroelectrics, 1994.ISAF '94., Proceedings of the Ninth IEEE International Symposium on
Conference_Location
University Park, PA
Print_ISBN
0-7803-1847-1
Type
conf
DOI
10.1109/ISAF.1994.522400
Filename
522400
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