DocumentCode
3157955
Title
Implant Isolation Characteristics for SoC Application
Author
Kim, Sungil ; Lee, Chulwook ; Baek, Yongsoon ; Moon, Jongtae
Author_Institution
IT Convergence & Component Lab., Electron. & Telecommun. Res. Inst., Daejeon
fYear
2006
fDate
10-13 Sept. 2006
Firstpage
403
Lastpage
405
Abstract
The isolation issue has manifested itself for system-on-chip (SoC) applications in future because it possesses a key technology for mixed-mode circuits. The authors have measured and analyzed implant isolation characteristics for high degree of isolation. The authors derived an equivalent circuit from the measurement and analysis of various implant conditions, which can be used for SoC design and fabrication fields
Keywords
equivalent circuits; isolation technology; mixed analogue-digital integrated circuits; system-on-chip; SoC application; equivalent circuit; implant isolation characteristics; mixed-mode circuits; system-on-chip applications; Application specific integrated circuits; Dielectric substrates; Equivalent circuits; Fabrication; Frequency measurement; Implants; Integrated circuit technology; Isolation technology; Laboratories; Microwave technology; Isolation; SoC; equivalent circuit; implant;
fLanguage
English
Publisher
ieee
Conference_Titel
European Microwave Integrated Circuits Conference, 2006. The 1st
Conference_Location
Manchester
Print_ISBN
2-9600551-8-7
Type
conf
DOI
10.1109/EMICC.2006.282667
Filename
4057661
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