Title :
Implant Isolation Characteristics for SoC Application
Author :
Kim, Sungil ; Lee, Chulwook ; Baek, Yongsoon ; Moon, Jongtae
Author_Institution :
IT Convergence & Component Lab., Electron. & Telecommun. Res. Inst., Daejeon
Abstract :
The isolation issue has manifested itself for system-on-chip (SoC) applications in future because it possesses a key technology for mixed-mode circuits. The authors have measured and analyzed implant isolation characteristics for high degree of isolation. The authors derived an equivalent circuit from the measurement and analysis of various implant conditions, which can be used for SoC design and fabrication fields
Keywords :
equivalent circuits; isolation technology; mixed analogue-digital integrated circuits; system-on-chip; SoC application; equivalent circuit; implant isolation characteristics; mixed-mode circuits; system-on-chip applications; Application specific integrated circuits; Dielectric substrates; Equivalent circuits; Fabrication; Frequency measurement; Implants; Integrated circuit technology; Isolation technology; Laboratories; Microwave technology; Isolation; SoC; equivalent circuit; implant;
Conference_Titel :
European Microwave Integrated Circuits Conference, 2006. The 1st
Conference_Location :
Manchester
Print_ISBN :
2-9600551-8-7
DOI :
10.1109/EMICC.2006.282667
