DocumentCode :
3158067
Title :
17.1% efficient truncated-pyramid inversion-layer silicon solar cells
Author :
Grauvogl, Manfred ; Aberle, Armin G. ; Hezel, Rudolf
Author_Institution :
Inst. fur Solarenergieforschung Hameln/Emmerthal, Germany
fYear :
1996
fDate :
13-17 May 1996
Firstpage :
433
Lastpage :
436
Abstract :
Metal-insulator-semiconductor inversion-layer (MIS-IL) silicon solar cells can be fabricated in a simple and cost-effective way. In order to exceed the present performance level, the front surface recombination losses have to be reduced for improved open-circuit voltages. With the novel truncated-pyramid concept it is possible to perform the passivation of the front surface prior to the MIS-contact formation. Thus, the restriction to temperatures around 250°C for the front surface passivation is eliminated and the effective recombination velocity Seff of the inversion-layer emitter can be strongly reduced to 200-400 cm/s. Point-like contact areas are opened at the tips of the random pyramids by means of chemical-mechanical polishing. As a result, VOC increases by about 40 mV and the efficiency improves to 17.1%
Keywords :
MIS devices; electron-hole recombination; elemental semiconductors; inversion layers; passivation; semiconductor device testing; silicon; solar cells; 17.1 percent; 250 C; MIS-contact formation; PV performance; Si; chemical-mechanical polishing; effective recombination velocity; fabrication; front surface passivation; front surface recombination losses; metal-insulator-semiconductor inversion-layer; open-circuit voltage; point-like contact areas; truncated-pyramid inversion-layer solar cells; Chemicals; Doping profiles; Metal-insulator structures; Passivation; Performance loss; Photovoltaic cells; Plasma temperature; Silicon; Surface texture; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
Conference_Location :
Washington, DC
ISSN :
0160-8371
Print_ISBN :
0-7803-3166-4
Type :
conf
DOI :
10.1109/PVSC.1996.564036
Filename :
564036
Link To Document :
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