• DocumentCode
    3158067
  • Title

    17.1% efficient truncated-pyramid inversion-layer silicon solar cells

  • Author

    Grauvogl, Manfred ; Aberle, Armin G. ; Hezel, Rudolf

  • Author_Institution
    Inst. fur Solarenergieforschung Hameln/Emmerthal, Germany
  • fYear
    1996
  • fDate
    13-17 May 1996
  • Firstpage
    433
  • Lastpage
    436
  • Abstract
    Metal-insulator-semiconductor inversion-layer (MIS-IL) silicon solar cells can be fabricated in a simple and cost-effective way. In order to exceed the present performance level, the front surface recombination losses have to be reduced for improved open-circuit voltages. With the novel truncated-pyramid concept it is possible to perform the passivation of the front surface prior to the MIS-contact formation. Thus, the restriction to temperatures around 250°C for the front surface passivation is eliminated and the effective recombination velocity Seff of the inversion-layer emitter can be strongly reduced to 200-400 cm/s. Point-like contact areas are opened at the tips of the random pyramids by means of chemical-mechanical polishing. As a result, VOC increases by about 40 mV and the efficiency improves to 17.1%
  • Keywords
    MIS devices; electron-hole recombination; elemental semiconductors; inversion layers; passivation; semiconductor device testing; silicon; solar cells; 17.1 percent; 250 C; MIS-contact formation; PV performance; Si; chemical-mechanical polishing; effective recombination velocity; fabrication; front surface passivation; front surface recombination losses; metal-insulator-semiconductor inversion-layer; open-circuit voltage; point-like contact areas; truncated-pyramid inversion-layer solar cells; Chemicals; Doping profiles; Metal-insulator structures; Passivation; Performance loss; Photovoltaic cells; Plasma temperature; Silicon; Surface texture; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
  • Conference_Location
    Washington, DC
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-3166-4
  • Type

    conf

  • DOI
    10.1109/PVSC.1996.564036
  • Filename
    564036