Title :
Determination of vulnerable machines for online transient security assessment in smart grid using artificial neural network
Author :
Verma, Kusum ; Niazi, K.R.
Author_Institution :
Dept. of Electr. Eng., Malaviya Nat. Inst. of Technol., Jaipur, India
Abstract :
Smart grid integrates effective harnessing of control, communication and computer technologies in the operation of present day bulk power system to create several possibilities for meeting challenges of the electricity industry. This paper presents an artificial neural network based approach for fast and accurate power system transient security assessment. Radial basis function (RBF) neural network is employed to assess the transient security status by identifying each vulnerable generating machine that will lose synchronism for a given operating condition. The model can serve as decision making tool for the power planners to take preventive control actions for generation shedding/rescheduling for online applications. A feature selection technique based on the class separability index and correlation coefficient has been employed. The effectiveness of the proposed methodology is demonstrated by overall accuracy of the test results for unknown patterns for IEEE 39-bus New England system.
Keywords :
decision making; neural nets; power engineering computing; power generation control; power generation scheduling; power system security; power system transients; smart power grids; IEEE 39-bus New England system; RBF neural network; artificial neural network; bulk power system; class separability index; communication technologies; computer technologies; control harnessing; decision making; electricity industry; generation shedding/rescheduling; power planners; power system transient security assessment; preventive control; radial basis function; smart grid; vulnerable generating machine; Artificial neural networks; Generators; Power system stability; Security; Training; Transient analysis; Artificial neural network; feature selection; radial basis function neural network; smart grid; transient security assessment;
Conference_Titel :
India Conference (INDICON), 2011 Annual IEEE
Conference_Location :
Hyderabad
Print_ISBN :
978-1-4577-1110-7
DOI :
10.1109/INDCON.2011.6139562