DocumentCode :
3158336
Title :
Ultra-Wideband Shielded Vertical Via Transitions from DC up to the V-Band
Author :
Kangasvieri, T. ; Halme, J. ; Vahakangas, J. ; Lahti, M.
Author_Institution :
Microelectron. & Mater. Phys. Labs., Oulu Univ.
fYear :
2006
fDate :
10-13 Sept. 2006
Firstpage :
476
Lastpage :
479
Abstract :
This paper presents three shielded vertical via transition designs applicable in millimeter-wave module packaging from DC up to the F-band. The optimized transition structures were fabricated using a standard low-temperature co-fired ceramic (LTCC) process. The measured scattering parameter results of the back-to-back via transition structures showed an exceptionally wide bandwidth with return losses better than 18 dB up to 50 GHz. The extracted insertion loss values of the single transitions were less than about 0.4 dB at 50 GHz. Moreover, full-wave electromagnetic (EM) simulations demonstrated the high potential of two of these via transitions up to 70 GHz
Keywords :
S-parameters; UHF integrated circuits; ceramic packaging; microwave integrated circuits; millimetre wave integrated circuits; modules; waveguide transitions; LTCC process; back-to-back via transition structures; full-wave electromagnetic simulations; insertion loss; low-temperature co-fired ceramic; millimeter-wave module packaging; optimized transition structures; scattering parameter; ultra-wideband shielded vertical via transitions; Bandwidth; Ceramics; Feeds; Millimeter wave technology; Nonhomogeneous media; Packaging; Radio frequency; Scattering parameters; Testing; Ultra wideband technology; Low-loss; low-temperature co-fired ceramic (LTCC); transition; wideband;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
European Microwave Integrated Circuits Conference, 2006. The 1st
Conference_Location :
Manchester
Print_ISBN :
2-9600551-8-7
Type :
conf
DOI :
10.1109/EMICC.2006.282686
Filename :
4057680
Link To Document :
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