DocumentCode :
3158480
Title :
Compact K-band Watt-level GaAs PHEMT Power Amplifier MMIC with integrated ESD protection
Author :
Bessemoulin, A. ; McCulloch, M.G. ; Alexander, A. ; McCann, D. ; Mahon, S.J. ; Harvey, J.T.
Author_Institution :
Mimix Broadband Inc., Houston, TX
fYear :
2006
fDate :
10-13 Sept. 2006
Firstpage :
517
Lastpage :
520
Abstract :
The performance of a compact K-band power amplifier MMIC fabricated in standard 6-inch 0.15-mum GaAs power PHEMT technology is reported. The circuit features on-chip ESD protection including input short-circuit stub, dual capacitors at RF ports and high-current diode arrays on each gate pad. Occupying less than 3 mm2, this 3-stage power amplifier achieves a linear gain of more than 20-dB over the 17 to 24 GHz frequency range with 6-dB noise figure. It also delivers a CW output power of more than 29-and 30-dBm, in the 17-20 GHz band, at 5- and 6-V respectively. Preliminary ESD characterization shows the circuit withstands 180-V in human body model test (tester limit), and 100-V machine model (equivalent to at least 500-V HBM), without DC or RF performance degradation. Finally, performance in standard 24-lead plastic QFN package (4times4 mm2) is presented: the device exhibits more than 17.5-dB linear gain over 17-24 GHz, with P-.1dB greater than 28-dBm in the 17.7-19.7 GHz radio range
Keywords :
HEMT integrated circuits; III-V semiconductors; MMIC; electrostatic discharge; gallium arsenide; microwave power amplifiers; wide band gap semiconductors; 0.15 micron; 100 V; 17 to 24 GHz; 180 V; 5 V; 6 V; 6 dB; GaAs; K-band; MMIC; PHEMT power amplifier; electrostatic discharge; human body model test; input short-circuit stub; linear gain amplifier; machine model; on-chip ESD protection; plastic QFN package; power PHEMT technology; Circuit testing; Electrostatic discharge; Gallium arsenide; K-band; MMICs; PHEMTs; Power amplifiers; Protection; Radio frequency; Radiofrequency amplifiers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
European Microwave Integrated Circuits Conference, 2006. The 1st
Conference_Location :
Manchester
Print_ISBN :
2-9600551-8-7
Type :
conf
DOI :
10.1109/EMICC.2006.282697
Filename :
4057691
Link To Document :
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