• DocumentCode
    3158686
  • Title

    End field structures for linear/helical insertion devices

  • Author

    Chavanne, J. ; Elleaume, P. ; Van Vaerenbergh, P.

  • Author_Institution
    ESRF, Grenoble, France
  • Volume
    4
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    2665
  • Abstract
    The field integral tolerances required on third generation synchrotron sources are of the order of 10-20 Gcm in the whole gap range of an insertion device. This can be achieved without electromagnet correction by a proper magnetic design of the field termination. The paper describes several such end field terminations to be used for planar undulators. A new termination valid for an APPLE II undulator is presented which produces a field integral variation smaller than 20 Gcm for any useful setting of the magnetic gap and phase. It compares quite favorably with other known type of terminations
  • Keywords
    electron accelerators; storage rings; wigglers; APPLE II undulator; end field structures; field integral tolerances; field integral variation; field termination; helical insertion devices; linear insertion devices; magnetic gap; planar undulators; third generation synchrotron sources; Extremities; Magnetic anisotropy; Magnetic devices; Magnetic field measurement; Magnetization; Manufacturing processes; Permanent magnets; Permeability; Perpendicular magnetic anisotropy; Undulators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Particle Accelerator Conference, 1999. Proceedings of the 1999
  • Conference_Location
    New York, NY
  • Print_ISBN
    0-7803-5573-3
  • Type

    conf

  • DOI
    10.1109/PAC.1999.792897
  • Filename
    792897