DocumentCode :
3158784
Title :
Simple approximations for degenerate non-parabolic semiconductors
Author :
Altschul, V. ; Bahir, G. ; Finkman, E.
Author_Institution :
Dept. of Electr. Eng., Technion-Israel Inst. of Technol., Haifa, Israel
fYear :
1991
fDate :
5-7 Mar 1991
Firstpage :
79
Lastpage :
82
Abstract :
The authors propose simple, explicit expressions that describe properties of semiconductor devices with nonparabolic energy bands. The new model includes effects of carrier degeneracy and impurity freeze-out. The approach is based on a recently proposed approximation for the semiconductor statistics derived from Kane´s k· p model. The authors use that approximation to calculate intrinsic properties of semiconductors, n·p product, and the Einstein relation. They then solve a one-dimensional Poisson´s equation and obtain a relationship between the total semiconductor charge and the surface potential. This method can be applied to heterojunction and field effect devices with wide and narrow band gaps. They use the new approach to calculate the incremental capacitance of an MIS structure and compare the results with an accurate numerical model and experimental measurements of an HgCdTe capacitor
Keywords :
II-VI semiconductors; cadmium compounds; capacitors; degenerate semiconductors; field effect devices; impurity electron states; k.p calculations; mercury compounds; narrow band gap semiconductors; semiconductor device models; surface potential; Einstein relation; HgCdTe; HgCdTe capacitor; Kane´s k·p model; MIS structure; carrier degeneracy; degenerate semiconductors; explicit expressions; field effect devices; heterojunction devices; impurity freeze-out; incremental capacitance; intrinsic properties; n·p product; nonparabolic energy bands; nonparabolic semiconductors; one-dimensional Poisson´s equation; semiconductor devices; semiconductor statistics approximation; surface potential; total semiconductor charge; Capacitors; Cities and towns; Electrons; Narrowband; Numerical models; Photonic band gap; Semiconductor devices; Semiconductor impurities; Semiconductor materials; Statistics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical and Electronics Engineers in Israel, 1991. Proceedings., 17th Convention of
Conference_Location :
Tel Aviv
Print_ISBN :
0-87942-678-0
Type :
conf
DOI :
10.1109/EEIS.1991.217707
Filename :
217707
Link To Document :
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