• DocumentCode
    3158874
  • Title

    Computer simulation of Doppler spectra associated with moving scatterers for different source configurations and arbitrary trajectories

  • Author

    Zonnenschein, Elazar ; Censor, Dan

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Ben Gurion Univ. of the Negev, Beer Sheva, Israel
  • fYear
    1991
  • fDate
    5-7 Mar 1991
  • Firstpage
    55
  • Lastpage
    58
  • Abstract
    A finite element method is developed for calculation of fields excited by focused ultrasonic radiators and scattered by moving particles, and the associated Doppler spectra. The algorithm was tested for known cases, e.g. the field along the axis of rectangular and circular aperture transducers. In all cases the algorithm generated data which adequately approximated solutions of simple canonical problems, and results published in the literature. The known phenomenon of Doppler spectra broadening in the presence of disturbed flow is simulated here. It is shown that broadening and ripple are related to nonlinear motion of particles within the sampling volume. Moreover, the results show that Doppler spectra broadening occurs around the Doppler central frequency and that the spectrum shape depends on the particle´s motional characteristics and the sampling density. The results show that broadened spectra attributed to flow reversal are similar to spectra resulting from a disturbed flow within the sampling volume
  • Keywords
    Doppler effect; acoustic radiators; finite element analysis; ultrasonic scattering; ultrasonic transducers; Doppler central frequency; Doppler spectra broadening; arbitrary trajectories; broadening; circular aperture transducers; disturbed flow; finite element method; flow reversal; focused ultrasonic radiators; motional characteristics; moving scatterers; nonlinear motion; rectangular transducers; ripple; sampling density; sampling volume; source configurations; spectrum shape; Apertures; Computer simulation; Doppler shift; Finite element methods; Frequency; Particle scattering; Sampling methods; Shape; Testing; Transducers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and Electronics Engineers in Israel, 1991. Proceedings., 17th Convention of
  • Conference_Location
    Tel Aviv
  • Print_ISBN
    0-87942-678-0
  • Type

    conf

  • DOI
    10.1109/EEIS.1991.217714
  • Filename
    217714