DocumentCode
3159019
Title
A computer vision approach for fabric defects inspection
Author
Liu Shu-Guang ; Qu Ping-Ge
Author_Institution
Xi´an Polytechnic University, 710048 China
fYear
2009
fDate
12-14 Oct. 2009
Firstpage
1
Lastpage
4
Abstract
In the textile production, there may appear many fabric defects. To fabric defects, there are a lot of image-based inspection techniques: Fourier transform, Sobel algorithm of edge inspection, fast Fourier transform (FFT) et. However, Wavelet transform is a kind of multiresolution algorithm, and its multiresolution character corresponds to time-frequency multiresolution of human vision. The result of the research indicates that wavelet transform gives better results than the other traditional methods. So in this article, we use wavelet transform and BP neural network together to inspect and classify the fabric defects. A plain white fabric is adopted as the sample, and the distinguishing defects are oil stains, warp-lacking, and weft-lacking. An area camera with 256×256 resolution is used in the scheme, a grabbed image is transmitted to a computer for wavelet transform, and then the corresponding image data are then used in BP neural network as input. The result shows that the fabric defects´ classification rate can be up to 95% with above method.
Keywords
computer vision; fabric defect; inspection; wavelet transform;
fLanguage
English
Publisher
iet
Conference_Titel
Technology and Innovation Conference 2009 (ITIC 2009), International
Conference_Location
Xian, China
Type
conf
DOI
10.1049/cp.2009.1521
Filename
5518602
Link To Document