Title :
Numerical simulation of innovative device structures for silicon thin-film solar cells
Author :
Rau, Uwe ; Meyer, Thorsten ; Goldbach, Matthias ; Brendel, Rolf ; Werner, Jürgen H.
Author_Institution :
Phys. Inst., Bayreuth Univ., Germany
Abstract :
We investigate the optical and electronic properties of thin-film silicon solar cells by means of numerical simulations. The optical design under investigation is the encapsulated-V texture which is capable of absorbing sunlight corresponding to a maximum short circuit current density of 35 mA/cm2. Since the layer thickness can be restricted to only 4 μm, the encapsulated-V structure provides also a good collection efficiency for photogenerated charge carriers. Practical efficiencies around 12% can be expected for Si material with a minority carrier lifetime as low as 10 ns. Increased lifetimes of 100 ns allow for about 14% efficiency. The benefit of multiple junctions strongly depends on surface recombination. The efficiency of a single junction cell can be improved from 10% to 13% by a three junction device if the surface recombination velocity is as high as 105 cm/s. For moderate surface recombination the gain is only 1%
Keywords :
carrier lifetime; current density; elemental semiconductors; encapsulation; minority carriers; optical properties; p-n junctions; semiconductor device packaging; semiconductor thin films; short-circuit currents; silicon; solar cells; surface recombination; 10 ns; 10 to 14 percent; 100 ns; 4 mum; Si; collection efficiency; electronic properties; encapsulated-V texture; innovative device structures; layer thickness; maximum short circuit current density; minority carrier lifetime; multiple junctions; optical properties; photogenerated charge carriers; silicon thin-film solar cells; single junction cell efficiency; surface recombination velocity; three junction device; Charge carrier lifetime; Charge carriers; Numerical simulation; Optical design; Optical films; Photovoltaic cells; Semiconductor thin films; Short circuit currents; Silicon; Thin film circuits;
Conference_Titel :
Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-3166-4
DOI :
10.1109/PVSC.1996.564045