DocumentCode :
3159637
Title :
Reliability modeling and optimization of MEMS elements in various devices using multi-scale concepts
Author :
Pathak, Rohit ; Joshi, Satyadhar
Author_Institution :
Comput. Sci. Dept., Acropolis Inst. of Technol. & Res., Indore, India
fYear :
2009
fDate :
25-26 July 2009
Firstpage :
332
Lastpage :
337
Abstract :
Diverse computational methods have brought powerful techniques to calculate reliability by multi scale modeling supported by experimental and theoretical methods. These approaches play an important role in micro electro mechanical systems (MEMS) technology where the analysis is based on abstraction level theories and no comprehensive explanation of nano scale phenomenon are proposed. It is proposed that high performance computing (HPC) if used with multi scale optimization library then the reliability calculation can be accelerated and also research in reliability of MEMS. In this work we have developed library where we can select the various physics at different level and then calculated reliability for better accuracy. In the proposed work, modeling and computation is performed using MATLAB distributed computing toolbox and Sugar MEMS simulation library. It is an extension to SUGAR package for MEMS.
Keywords :
distributed processing; electronic engineering computing; micromechanical devices; optimisation; semiconductor device reliability; MATLAB distributed computing toolbox; MEMS element; Sugar MEMS simulation library; high performance computing; microelectromechanical system; multiscale optimization; nanoscale phenomenon; reliability modeling; Computational modeling; Distributed computing; High performance computing; Libraries; Mathematical model; Mechanical systems; Micromechanical devices; Power system modeling; Power system reliability; Reliability theory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Innovative Technologies in Intelligent Systems and Industrial Applications, 2009. CITISIA 2009
Conference_Location :
Monash
Print_ISBN :
978-1-4244-2886-1
Electronic_ISBN :
978-1-4244-2887-8
Type :
conf
DOI :
10.1109/CITISIA.2009.5224187
Filename :
5224187
Link To Document :
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