• DocumentCode
    3159861
  • Title

    A/D converter using Iterative Divide-by-Two Reference for CMOS image sensor

  • Author

    Lee, Jeonghwan ; Han, Gunhee

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Yonsei Univ., Seoul
  • Volume
    03
  • fYear
    2008
  • fDate
    24-25 Nov. 2008
  • Abstract
    This paper proposes an ADC using Iterative Divide-by-Two Reference. Using and sharing a single voltage divider reduces silicon area for a column compared with the conventional SA-ADC. An offset-cancelled integrator and a capacitor error averaging method are implemented to decrease the impact of nonlinearities. The ADC is designed in 0.18-mum CMOS process and consumes 0.35-mW of power per ADC, and the active die area is 0.012-mm2.
  • Keywords
    CMOS image sensors; analogue-digital conversion; voltage dividers; A/D converter; CMOS image sensor; capacitor error averaging method; iterative divide-by-two reference; offset-cancelled integrator; power 0.35 mW; voltage divider; CMOS image sensors; Capacitors; Computational Intelligence Society; Energy consumption; Image converters; Image sensors; Registers; Sensor arrays; Silicon; Voltage; CIS; SA-ADC; column-parallel ADC; component;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SoC Design Conference, 2008. ISOCC '08. International
  • Conference_Location
    Busan
  • Print_ISBN
    978-1-4244-2598-3
  • Electronic_ISBN
    978-1-4244-2599-0
  • Type

    conf

  • DOI
    10.1109/SOCDC.2008.4815737
  • Filename
    4815737
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3159861