• DocumentCode
    3159933
  • Title

    In-situ control in zone-melting recrystallization process for formation of high-quality thin film polycrystalline Si

  • Author

    Kawama, Y. ; Takami, A. ; Naomoto, H. ; Hamamoto, S. ; Ishihara, Takuya

  • Author_Institution
    Photovoltaic Devices Technol. Center, Mitsubishi Electr. Corp., Hyogo, Japan
  • fYear
    1996
  • fDate
    13-17 May 1996
  • Firstpage
    481
  • Lastpage
    484
  • Abstract
    Newly developed zone-melting recrystallization (ZMR) apparatus for formation of thin film polycrystalline Si is introduced. In ZMR method, the fine temperature control is required for formation of high quality crystal over the large area with high uniformity. Therefore, monitoring of melting zone by means of CCD camera was employed. In this system, the width of melting zone was kept constant by controlling the output power of melting heater based on monitoring CCD-image. Reliability of this controlling system was confirmed by evaluating the quality of ZMR-Si by changing scanning speed and output power of melting heater which corresponds to the width of melting zone. As a result, {100} oriented thin film polycrystalline Si (0.3-3 μm thick) with low dislocation density of 2-3×106 cm-2 was successfully obtained all over 6" φ substrate
  • Keywords
    elemental semiconductors; recrystallisation; semiconductor growth; semiconductor thin films; silicon; temperature control; zone melting; zone melting recrystallisation; 0.3 to 3.0 mum; Si; fine temperature control; high-quality thin film polycrystalline Si; melting heater; output power; scanning speed; zone-melting recrystallization process; Charge coupled devices; Charge-coupled image sensors; Monitoring; Power generation; Process control; Semiconductor thin films; Substrates; Temperature control; Thin film devices; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
  • Conference_Location
    Washington, DC
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-3166-4
  • Type

    conf

  • DOI
    10.1109/PVSC.1996.564048
  • Filename
    564048