DocumentCode
3160223
Title
Wire Sweep Improvement Study for Fine Pitch Device
Author
Liu, J.M. ; Yao, J.Z. ; Wei, Gao ; Lu, Y.S.
Author_Institution
Freescale Semicond. (China) Ltd., Shenzhen
fYear
2007
fDate
10-12 Dec. 2007
Firstpage
61
Lastpage
65
Abstract
This paper presents the results of a wire sweep improvement study for fine pitch devices. With 44mum fine pitch device as test vehicle, on one hand, transfer mold process optimization with transfer profile was performed and wire sweep was controlled below 5%; on the other hand, new FFT (Flow Free Thin) mold technology with new granular compound was also evaluated to improve wire sweep and it can get excellent wire sweep control within 1.5%. With 40mum fine pitch device as test vehicle, the stiffer gold wire (2N type, 99% Au purity) was also tried for comparison with current gold wire (3N type, 99.9% Au purity) and the wire sweep data showed a large improvement on 2N wire. All the study experience will guide further study in ultra fine pitch (37mum or 35mum) and fine gold wire (0.7mils or 0.6mils).
Keywords
electronics packaging; moulding; wires (electric); Au; fine pitch device; flow free thin mold technology; granular compound; transfer mold process optimization; transfer profile; wire sweep improvement study; Bonding; Electronic equipment testing; Gold; Laboratories; Performance evaluation; Semiconductor device packaging; Strips; Vehicles; Vents; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Packaging Technology Conference, 2007. EPTC 2007. 9th
Conference_Location
Singapore
Print_ISBN
978-1-4244-1323-2
Electronic_ISBN
978-1-4244-1323-2
Type
conf
DOI
10.1109/EPTC.2007.4469697
Filename
4469697
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