• DocumentCode
    3160223
  • Title

    Wire Sweep Improvement Study for Fine Pitch Device

  • Author

    Liu, J.M. ; Yao, J.Z. ; Wei, Gao ; Lu, Y.S.

  • Author_Institution
    Freescale Semicond. (China) Ltd., Shenzhen
  • fYear
    2007
  • fDate
    10-12 Dec. 2007
  • Firstpage
    61
  • Lastpage
    65
  • Abstract
    This paper presents the results of a wire sweep improvement study for fine pitch devices. With 44mum fine pitch device as test vehicle, on one hand, transfer mold process optimization with transfer profile was performed and wire sweep was controlled below 5%; on the other hand, new FFT (Flow Free Thin) mold technology with new granular compound was also evaluated to improve wire sweep and it can get excellent wire sweep control within 1.5%. With 40mum fine pitch device as test vehicle, the stiffer gold wire (2N type, 99% Au purity) was also tried for comparison with current gold wire (3N type, 99.9% Au purity) and the wire sweep data showed a large improvement on 2N wire. All the study experience will guide further study in ultra fine pitch (37mum or 35mum) and fine gold wire (0.7mils or 0.6mils).
  • Keywords
    electronics packaging; moulding; wires (electric); Au; fine pitch device; flow free thin mold technology; granular compound; transfer mold process optimization; transfer profile; wire sweep improvement study; Bonding; Electronic equipment testing; Gold; Laboratories; Performance evaluation; Semiconductor device packaging; Strips; Vehicles; Vents; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference, 2007. EPTC 2007. 9th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-1323-2
  • Electronic_ISBN
    978-1-4244-1323-2
  • Type

    conf

  • DOI
    10.1109/EPTC.2007.4469697
  • Filename
    4469697