Title :
Advanced Mechanical Design and Control Methods for Atomic Force Microscopy in Real-Time
Author_Institution :
Delft Univ. of Technol., Delft
Abstract :
This article reviews mechanical design and control of atomic force microscopes (AFM) with a special emphasis on high-speed imaging. The mechanical design and the control system determine the achievable imaging speed of the AFM. To enable AFM imaging at video-rates, imaging speed - and thus system performance - has to be increased by at least two orders of magnitude relative to today´s commercial AFMs. Methods and results presented in this paper demonstrate how this can be achieved.
Keywords :
atomic force microscopy; advanced mechanical design-control methods; atomic force microscopy; high-speed imaging; video-rates; Atomic force microscopy; Bandwidth; Control systems; Design methodology; Force control; Instruments; Optical imaging; Piezoelectric actuators; Resonance; Resonant frequency;
Conference_Titel :
American Control Conference, 2007. ACC '07
Conference_Location :
New York, NY
Print_ISBN :
1-4244-0988-8
Electronic_ISBN :
0743-1619
DOI :
10.1109/ACC.2007.4282253