• DocumentCode
    3160242
  • Title

    Advanced Mechanical Design and Control Methods for Atomic Force Microscopy in Real-Time

  • Author

    Schitter, Georg

  • Author_Institution
    Delft Univ. of Technol., Delft
  • fYear
    2007
  • fDate
    9-13 July 2007
  • Firstpage
    3503
  • Lastpage
    3508
  • Abstract
    This article reviews mechanical design and control of atomic force microscopes (AFM) with a special emphasis on high-speed imaging. The mechanical design and the control system determine the achievable imaging speed of the AFM. To enable AFM imaging at video-rates, imaging speed - and thus system performance - has to be increased by at least two orders of magnitude relative to today´s commercial AFMs. Methods and results presented in this paper demonstrate how this can be achieved.
  • Keywords
    atomic force microscopy; advanced mechanical design-control methods; atomic force microscopy; high-speed imaging; video-rates; Atomic force microscopy; Bandwidth; Control systems; Design methodology; Force control; Instruments; Optical imaging; Piezoelectric actuators; Resonance; Resonant frequency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference, 2007. ACC '07
  • Conference_Location
    New York, NY
  • ISSN
    0743-1619
  • Print_ISBN
    1-4244-0988-8
  • Electronic_ISBN
    0743-1619
  • Type

    conf

  • DOI
    10.1109/ACC.2007.4282253
  • Filename
    4282253