DocumentCode :
3160242
Title :
Advanced Mechanical Design and Control Methods for Atomic Force Microscopy in Real-Time
Author :
Schitter, Georg
Author_Institution :
Delft Univ. of Technol., Delft
fYear :
2007
fDate :
9-13 July 2007
Firstpage :
3503
Lastpage :
3508
Abstract :
This article reviews mechanical design and control of atomic force microscopes (AFM) with a special emphasis on high-speed imaging. The mechanical design and the control system determine the achievable imaging speed of the AFM. To enable AFM imaging at video-rates, imaging speed - and thus system performance - has to be increased by at least two orders of magnitude relative to today´s commercial AFMs. Methods and results presented in this paper demonstrate how this can be achieved.
Keywords :
atomic force microscopy; advanced mechanical design-control methods; atomic force microscopy; high-speed imaging; video-rates; Atomic force microscopy; Bandwidth; Control systems; Design methodology; Force control; Instruments; Optical imaging; Piezoelectric actuators; Resonance; Resonant frequency;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
American Control Conference, 2007. ACC '07
Conference_Location :
New York, NY
ISSN :
0743-1619
Print_ISBN :
1-4244-0988-8
Electronic_ISBN :
0743-1619
Type :
conf
DOI :
10.1109/ACC.2007.4282253
Filename :
4282253
Link To Document :
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