DocumentCode
3160242
Title
Advanced Mechanical Design and Control Methods for Atomic Force Microscopy in Real-Time
Author
Schitter, Georg
Author_Institution
Delft Univ. of Technol., Delft
fYear
2007
fDate
9-13 July 2007
Firstpage
3503
Lastpage
3508
Abstract
This article reviews mechanical design and control of atomic force microscopes (AFM) with a special emphasis on high-speed imaging. The mechanical design and the control system determine the achievable imaging speed of the AFM. To enable AFM imaging at video-rates, imaging speed - and thus system performance - has to be increased by at least two orders of magnitude relative to today´s commercial AFMs. Methods and results presented in this paper demonstrate how this can be achieved.
Keywords
atomic force microscopy; advanced mechanical design-control methods; atomic force microscopy; high-speed imaging; video-rates; Atomic force microscopy; Bandwidth; Control systems; Design methodology; Force control; Instruments; Optical imaging; Piezoelectric actuators; Resonance; Resonant frequency;
fLanguage
English
Publisher
ieee
Conference_Titel
American Control Conference, 2007. ACC '07
Conference_Location
New York, NY
ISSN
0743-1619
Print_ISBN
1-4244-0988-8
Electronic_ISBN
0743-1619
Type
conf
DOI
10.1109/ACC.2007.4282253
Filename
4282253
Link To Document