• DocumentCode
    3160557
  • Title

    Study of Thermal and Thermo-Mechanical Behavior in a Multi-Chip-Composed Optoelectronic Package

  • Author

    Tian, J. ; Bartek, M.

  • Author_Institution
    Delft Univ. of Technol., Delft
  • fYear
    2007
  • fDate
    10-12 Dec. 2007
  • Firstpage
    886
  • Lastpage
    891
  • Abstract
    In this paper, thermal and thermo-mechanical behavior of a multi-chip-composed (MCM) optoelectronic package is analyzed. The optoelectronic module consists of a common silicon platform on which an InP optoelectronic chip and one or more silicon control circuitry chips are flip-chip mounted. The InP chip contains a semiconductor optical amplifier (SOA) which optical gain is temperature sensitive and therefore requires thermal stabilization. The SOA itself generates significant heat flux and, due to the coefficient of the thermal extension (CTE) mismatch between the different package elements, thermo-mechanical stress is generated during device operation. This stress has to be reduced in order to improve the reliability of the packaged system. In our current work, the factors that mostly affect the performance of the SOA thermally and thermo-mechanically i.e. the geometry and count of Au/Sn solder bumps, are analyzed with extensive thermal simulations using Ansoft ePhysicstrade.
  • Keywords
    indium compounds; integrated circuit reliability; integrated optoelectronics; multichip modules; semiconductor optical amplifiers; thermal management (packaging); thermomechanical treatment; Ansoft ePhysics; Au-Sn; InP; SOA; heat flux; multichip-composed optoelectronic package; optical gain; packaged system reliability; semiconductor optical amplifier; silicon control circuitry chips; solder bumps; thermal behavior; thermal extension mismatch; thermal simulation; thermal stabilization; thermo-mechanical behavior; thermo-mechanical stress; Circuits; Indium phosphide; Optical sensors; Semiconductor device packaging; Semiconductor optical amplifiers; Silicon; Stimulated emission; Thermal factors; Thermal stresses; Thermomechanical processes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference, 2007. EPTC 2007. 9th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-1323-2
  • Electronic_ISBN
    978-1-4244-1323-2
  • Type

    conf

  • DOI
    10.1109/EPTC.2007.4469713
  • Filename
    4469713