• DocumentCode
    3160596
  • Title

    Accelerated Ageing and Solderability Test of Tin Plated Components

  • Author

    Dittes, Marc ; Haubner, Gerhard

  • Author_Institution
    Infineon Technol. AG, Regensburg
  • fYear
    2007
  • fDate
    10-12 Dec. 2007
  • Firstpage
    79
  • Lastpage
    85
  • Abstract
    With the introduction of lead (Pb)-free surface finishes on semiconductor components the solderability test conditions used for SnPb surface finishes need a review for their applicability. Due to the lack of data about the correlation of natural ageing and accelerated ageing on the one hand and the correlation of a solderability test like "dip & look" to real board assembly conditions on the other hand it is hardly possible to decide on a solderability test set-up reproducing the reality. In this paper we introduce a suitable mathematical model for the oxidation kinetics of tin surfaces and establish a correlation of natural ageing to accelerated ageing. In a second part results of solderability test are correlated to results from real board assembly.
  • Keywords
    life testing; soldering; solders; tin alloys; accelerated ageing; lead free surface finishing; natural ageing; oxidation kinetics; semiconductor components; solderability test condition; tin plated components; Accelerated aging; Assembly; Kinetic theory; Lead compounds; Life estimation; Mathematical model; Oxidation; Semiconductor device testing; Surface finishing; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference, 2007. EPTC 2007. 9th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-1323-2
  • Electronic_ISBN
    978-1-4244-1323-2
  • Type

    conf

  • DOI
    10.1109/EPTC.2007.4469716
  • Filename
    4469716