Title :
Control of back surface reflectance from aluminum alloyed contacts on silicon solar cells
Author :
Cudzinovic, Michael ; Sopori, Bhushan
Author_Institution :
Nat. Renewable Energy Lab., Golden, CO, USA
Abstract :
A process for forming highly reflective aluminum back contacts with low contact resistance to silicon solar cells is described. By controlling the process conditions, it is possible to vary the silicon/aluminum interface from a specular to a diffuse reflector while maintaining a high interface reflectance. The specular interface is found to be a uniform silicon/aluminum alloy layer a few angstroms thick that has epitaxially regrown on the silicon. The diffuse interface consists of randomly distributed (111) pyramids produced by crystallographic out-diffusion of the bulk silicon. The light trapping ability of the diffuse contact is found to be close to the theoretical limit. Both types of contacts are found to have specific contact resistivities of 10-5 Ω2-cm2. The process for forming the contacts involves illuminating the devices with tungsten halogen lamps. The process is rapid (under 100 s) and low temperature (peak temperature <580°C), making it favorable for commercial solar cell fabrication
Keywords :
aluminium alloys; contact resistance; electrical contacts; elemental semiconductors; reflectivity; semiconductor device metallisation; semiconductor-metal boundaries; silicon; solar cells; Si; Si solar cells; aluminum alloyed contacts; back surface reflectance control; crystallographic out-diffusion; diffuse contact; diffuse interface; diffuse reflector; high interface reflectance; light trapping ability; low contact resistance; process conditions control; randomly distributed (111) pyramids; silicon solar cells; silicon/aluminum interface; tungsten halogen lamps; Aluminum alloys; Conductivity; Contact resistance; Crystallography; Photovoltaic cells; Process control; Reflectivity; Silicon; Surface resistance; Temperature;
Conference_Titel :
Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-3166-4
DOI :
10.1109/PVSC.1996.564053