DocumentCode
3160845
Title
Air Flow Modeling and Analysis for Thermal Management in Functional Burn-In Systems
Author
Zhang, H.Y. ; Mui, Y.C. ; Mandal, R.
Author_Institution
AMD Pte Ltd (Singapore), Singapore
fYear
2007
fDate
10-12 Dec. 2007
Firstpage
172
Lastpage
178
Abstract
Functional burn-in testing has become one of the major benchmark testing for computer processors recently. In this study, the air flow modeling and simulation in functional burn-in systems have been conducted with multiple fans for convection dominated thermal enhancement. In the tray-level modeling, the duct tray with three mother boards and dual processors are constructed with the thermal head on top of the duct tray. Two tray fan configurations, the 3-fan tray and the 4-fan tray, are examined. In comparison, the 4-fan tray provides a more uniform flow across the card clusters at reduced levels of noise and system impedance at the same flowrate. In the rack level model, the exhausting flow capacity becomes a key factor for the flow optimization. The tray flow performance for the rack with 3-fan trays is greatly suppressed due to the use of a limited exhaust fan. In comparison, the tray flow performance for the rack with 4-fan trays is not affected significantly since its flowrate range match with the exhaust fan flow range. The design guidelines and recommendations at the rack level are also presented and discussed.
Keywords
aerodynamics; computational fluid dynamics; convection; fans; flow simulation; life testing; microprocessor chips; semiconductor device models; semiconductor device testing; thermal management (packaging); 3-fan trays; 4-fan trays; air flow modeling; air flow simulation; computer processors; convection dominated thermal enhancement; dual processors; duct tray; flow optimization; functional burn-in testing; mother boards; multiple fans; rack level model; system impedance; thermal management; tray flow performance; tray-level modeling; two tray fan configurations; Benchmark testing; Computational modeling; Ducts; Fans; Guidelines; Impedance; Noise level; Noise reduction; Thermal conductivity; Thermal management;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Packaging Technology Conference, 2007. EPTC 2007. 9th
Conference_Location
Singapore
Print_ISBN
978-1-4244-1323-2
Electronic_ISBN
978-1-4244-1323-2
Type
conf
DOI
10.1109/EPTC.2007.4469730
Filename
4469730
Link To Document