• DocumentCode
    3160936
  • Title

    Stability analysis for decentralized control of multi-evaporator vapor-compression cycle systems

  • Author

    Jain, Nikhil ; Sundaram, Suresh ; Alleyne, Andrew G.

  • Author_Institution
    Dept. of Mech. Sci. & Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
  • fYear
    2012
  • fDate
    10-13 Dec. 2012
  • Firstpage
    7589
  • Lastpage
    7595
  • Abstract
    We consider the problem of stabilizing multi-evaporator vapor-compression cycle (ME-VCC) systems using decentralized controllers. ME-VCC systems, sometimes termed variable-refrigerant-flow systems, are prevalent in large buildings that maintain independent cooled spaces with a single heat rejection unit. We exploit the time-scale separation characteristic of ME-VCC systems and analyze the faster mass flow dynamics and their stability characteristics independently of the slower thermal dynamics in the system. An electrical circuit analogy is used to obtain a linearized state-space representation of the mass flow dynamics for two common architectures of ME-VCC systems. Using concepts from decentralized control theory, we provide conditions under which local static feedback controllers stabilize the overall closed-loop system with robustness to uncertainties in the coupling between subsystems. Our analysis characterizes the beneficial impact that discharge pressure regulating (DPR) valves have on the decentralized controller gains.
  • Keywords
    closed loop systems; compressors; decentralised control; feedback; stability; valves; ME-VCC systems; closed-loop system; decentralized control theory; discharge pressure regulating valves; electrical circuit analogy; independent cooled spaces; linearized state-space representation; local static feedback controllers; mass flow dynamics; multievaporator vapor compression cycle systems; single heat rejection unit; stability analysis; thermal dynamics; time-scale separation characteristic; variable-refrigerant-flow systems; Mathematical model; Refrigerants; Resistance; Resistors; Silicon; Stability analysis; Valves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Decision and Control (CDC), 2012 IEEE 51st Annual Conference on
  • Conference_Location
    Maui, HI
  • ISSN
    0743-1546
  • Print_ISBN
    978-1-4673-2065-8
  • Electronic_ISBN
    0743-1546
  • Type

    conf

  • DOI
    10.1109/CDC.2012.6425908
  • Filename
    6425908