DocumentCode :
3160952
Title :
On The Ambiguity In Inverse Problems Using A Sampled Pattern Matching Method
Author :
Iwahashi, M. ; Ueno, S.
Author_Institution :
Tohwa University
fYear :
1993
fDate :
13-16 April 1993
Keywords :
Conductors; Current distribution; Current measurement; Fluid flow measurement; Inverse problems; Magnetic field measurement; Pattern matching; Position measurement; Scanning probe microscopy; Volume measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 1993. INTERMAG '93., Digest of International
Conference_Location :
Stockhom, Sweden
Print_ISBN :
0-7803-1310-0
Type :
conf
DOI :
10.1109/INTMAG.1993.642591
Filename :
642591
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3160952
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