Title :
Analysis of the Effect of AC Noise on DC Bias of VGA for UHF RFID using Chip-package Co-modeling and Simulation
Author :
Lee, Hyein ; Shim, Yujeong ; Park, Hyungjeong ; Ryu, Chunghyun ; Yoon, Changwook ; Kim, Joungho
Author_Institution :
Terahertz Interconnection & Package Lab., Daejon
Abstract :
Ever since radio frequency identification (RFID) was first introduced, the demand for smaller and low-power-consuming RFID system never stopped increasing. Many researchers dealt and successfully reduced the size. But as the size of and RFID system is reduced, the noise coupling between blocks became more severe. Especially, when noise is coupled to variable gain amplifier (VGA) block, the output may be damaged and lead to failure in reading tags. But finding and simulating sources and effect of noise is very complicated and time consuming. Thus, it is crucial to model and simplify the system. In this paper, the noise and its effect on VGA for UHF RFID is modeled, simulated, and modeled.
Keywords :
UHF amplifiers; chip scale packaging; integrated circuit modelling; integrated circuit noise; low-power electronics; radiofrequency identification; AC noise effect analysis; DC bias; VGA; chip-package co-modeling; circuit simulation; equivalent circuit model; low -power-consuming RFID system; radio frequency identification; variable gain amplifier; Analytical models; Radiofrequency identification;
Conference_Titel :
Electronics Packaging Technology Conference, 2007. EPTC 2007. 9th
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-1323-2
Electronic_ISBN :
978-1-4244-1323-2
DOI :
10.1109/EPTC.2007.4469739