Analysis of the Effect of AC Noise on DC Bias of VGA for UHF RFID using Chip-package Co-modeling and Simulation

Author

Lee, Hyein ; Shim, Yujeong ; Park, Hyungjeong ; Ryu, Chunghyun ; Yoon, Changwook ; Kim, Joungho

Author_Institution

Terahertz Interconnection & Package Lab., Daejon

fYear

2007

fDate

10-12 Dec. 2007

Firstpage

591

Lastpage

594

Abstract

Ever since radio frequency identification (RFID) was first introduced, the demand for smaller and low-power-consuming RFID system never stopped increasing. Many researchers dealt and successfully reduced the size. But as the size of and RFID system is reduced, the noise coupling between blocks became more severe. Especially, when noise is coupled to variable gain amplifier (VGA) block, the output may be damaged and lead to failure in reading tags. But finding and simulating sources and effect of noise is very complicated and time consuming. Thus, it is crucial to model and simplify the system. In this paper, the noise and its effect on VGA for UHF RFID is modeled, simulated, and modeled.

Keywords

UHF amplifiers; chip scale packaging; integrated circuit modelling; integrated circuit noise; low-power electronics; radiofrequency identification; AC noise effect analysis; DC bias; VGA; chip-package co-modeling; circuit simulation; equivalent circuit model; low -power-consuming RFID system; radio frequency identification; variable gain amplifier; Analytical models; Radiofrequency identification;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronics Packaging Technology Conference, 2007. EPTC 2007. 9th

Conference_Location

Singapore

Print_ISBN

978-1-4244-1323-2

Electronic_ISBN

978-1-4244-1323-2

Type

conf

DOI

10.1109/EPTC.2007.4469739

Filename

4469739