DocumentCode :
3161256
Title :
Moments of parameter estimates for Chung-Lu random graph models
Author :
Arcolano, Nicholas ; Ni, Karl ; Miller, Benjamin A. ; Bliss, Nadya T. ; Wolfe, Patrick J.
Author_Institution :
MIT Lincoln Lab., Lexington, MA, USA
fYear :
2012
fDate :
25-30 March 2012
Firstpage :
3961
Lastpage :
3964
Abstract :
As abstract representations of relational data, graphs and networks find wide use in a variety of fields, particularly when working in non-Euclidean spaces. Yet for graphs to be truly useful in in the context of signal processing, one ultimately must have access to flexible and tractable statistical models. One model currently in use is the Chung-Lu random graph model, in which edge probabilities are expressed in terms of a given expected degree sequence. An advantage of this model is that its parameters can be obtained via a simple, standard estimator. Although this estimator is used frequently, its statistical properties have not been fully studied. In this paper, we develop a central limit theory for a simplified version of the Chung-Lu parameter estimator. We then derive approximations for moments of the general estimator using the delta method, and confirm the effectiveness of these approximations through empirical examples.
Keywords :
approximation theory; estimation theory; graph theory; parameter estimation; probability; random processes; signal processing; statistical analysis; Chung-Lu parameter estimator; Chung-Lu random graph model; approximation theory; central limit theory; delta method; edge probability; expected degree sequence; nonEuclidean space; relational data abstract representation; signal processing; standard estimator; statistical model; Approximation methods; Computational modeling; Data models; Random variables; Reactive power; Standards; Vectors; central limit theory; delta method; given expected degree models; graphs and networks; parameter estimation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Acoustics, Speech and Signal Processing (ICASSP), 2012 IEEE International Conference on
Conference_Location :
Kyoto
ISSN :
1520-6149
Print_ISBN :
978-1-4673-0045-2
Electronic_ISBN :
1520-6149
Type :
conf
DOI :
10.1109/ICASSP.2012.6288785
Filename :
6288785
Link To Document :
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