DocumentCode :
3161357
Title :
A design and manufacturing solution for high-reliable, non-leaded CSPs like QFN
Author :
Kuhnlein, Gerd
Author_Institution :
ESEC SA, Cham, Switzerland
fYear :
2001
fDate :
2001
Firstpage :
47
Lastpage :
53
Abstract :
One of the new extremely miniaturized IC-packages, first presented by Matsushita under the designation QFN, has rapidly become popular with fast growing numbers. One concern is the limited device reliability, which requires improvements aimed from the main market like telecommunication and automotive electronic manufacturers. By carefully analyzing all the constraints which limits the device- and board assembly quality of such new devices by using all the experiences from the past and by taking in consideration the capabilities of existing and well established assembly and packaging technologies, it should be possible to build and economically manufacture such devices in high volume, achieving the required board assembly quality and device reliability in the requested cost frame
Keywords :
chip scale packaging; reliability; CSP; IC package; QFN; design; manufacture; reliability; Assembly; Electronic equipment manufacture; Electronics packaging; Lead; Manufacturing processes; Packaging machines; Pins; Process design; Pulp manufacturing; Semiconductor device manufacture;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2001. Proceedings., 51st
Conference_Location :
Orlando, FL
ISSN :
0569-5503
Print_ISBN :
0-7803-7038-4
Type :
conf
DOI :
10.1109/ECTC.2001.927683
Filename :
927683
Link To Document :
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